B1506A common features

• Wide operation range up to 3 kV/1500 A
• Fully automated fast thermal test from -50 °C to +250 °C
• Automatic power device (semiconductor and component) datasheet creation
• Auto record function to prevent data loss

B1506A IV package features

• Fully automated fast IV measurement (Ron, BV, Leakage, Vth, Vsat, etc) for both package and on-wafer devices
• Narrow IV pulse widths (down to 10 μs) to prevent device self-heating for revealing actual device performance
• Oscilloscope view (Time-domain view) to monitor actual voltage/current pulsed waveforms for accurate measurement
• Scalable configuration to add CV and Qg, to expand current range from 20A to 500 A, 1500 A

B1506A full package features

• All of the IV package features
• Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss, Cies, Coes, Cres) and gate resistance (Rg) at 3kV for package devices
• Gate charge (Qg) curve measurement for package devices
• Power loss (conduction, driving and switching loss) calculation

B1506A IV Package

• B1506A-H20 20 A / 3 kV IV measurement
• B1506A-H50 500 A / 3 kV IV measurement
• B1506A-H70 1500 A / 3 kV IV measurement

B1506A Full Package

• B1506A-H21 20 A / 3 kV IV, C-V and Gate charge measurement
• B1506A-H51 500 A / 3 kV IV, C-V and Gate charge measurement
• B1506A-H71 1500 A / 3 kV IV, C-V and Gate charge measurement